At Advanced Surface Microscopy, we make our expertise available to you in a variety of ways.
Atomic Force and other Scanning Probe Microscopes can provide a wealth of information. Making the most of that information requires skilled microscope operators who understand the best ways to prepare and mount samples, to run the microscope, and to interpret images and their analyses. Our experts can come to your lab to train your operators on your equipment so you can get the most information for your analysis dollar.
- We have some simple experiments that can illustrate some of the AFM’s basic capabilities.
In the course of using results from a microscopy lab, questions can arise, challenges need to be overcome, problems need to be solved. Contact us for consultation to get that extra bit of expertise to carry you over rough spots in your work.
- Expert Services
In patent infringement and other legal matters, our ability to look at and analyze surfaces can help get to the root of the case. As recognized experts in the field, we can testify on important details to help resolve your case.
Company founder and President Donald A. Charnoff has been using Scanning Tunneling, Atomic Force, and other forms of Scanning Probe Microscopes since 1986 and is one of the pioneers in the field. In 1990 he founded Advanced Surface Microscopy and has been specializing in these forms of microscopy ever since.
Senior Analytical Scientist David L. Burkhead first started using Scanning Tunneling and Atomic Force Microscopes in 1996. On graduation the next year he came to work for Advanced Surface Microscopy where he has been involved in Atomic Force Microscoy ever since.