SPM, AFM, STM, and SEM Calibration Samples
(Nominal pitch values are approximate and for informational purposes only. See calibration certificates provided with the specimens for more detailed information.)
Traceable Calibration Specimens
| Item | Nominal Pitch (nm) | Price |
| 70-1DUTC Traceable Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si.Limited number available.
Substrate: Silicon about 4×3 mm. Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request. Available mounted on SEM stub at extra cost (see “SEM mount, cert.”) |
70 | $5070 |
| Model 145TC Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass.
Substrate: Glass about 4×6 mm. Default mounting: on 12 or 15 mm diam. steel disk. |
144 | $4159 |
| Model 150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si…Substrate: Silicon about 4×3 mm…Default mounting: on 12 or 15 mm diam. steel disk…Available unmounted on request. ..Available mounted on SEM stub at extra cost (see ‘SEM mount, cert.’). | 144 | $7432 |
| Model 292UTC Universal Traceable Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual period), Ti on Si.
Substrate: Silicon about 4×3 mm. Default mounting: Unmounted. Available mounted on 12 or 15 mm diam. steel disk on request. Available mounted on SEM stub at extra cost (see ‘SEM mount, cert.’).. |
292 | $4774 |
| Model 700-1DUTC Universal Traceable Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to calibration certificate for actual period), W-coated photoresist on Si.
Substrate: Silicon about 4×3 mm. Default mounting: Unmounted. Available mounted on 12 or 15 mm diam. steel disk on request. Available mounted on SEM stub at extra cost (see “SEM mount, cert.”) |
700 | $4068 |
Calibration References
| Item | Nominal Pitch (nm) | Price |
| Model 70-1D Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si.
Substrate: Silicon about 4×3 mm. Mounted on Steel Disk Very limited number available. |
70 | $1661 |
| Model 150-1D Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass.
Substrate: Glass about 4×6 mm. Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request… |
144 | $750 |
| Model 150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si.
Substrate: Silicon about 4×3 mm…Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request.. Available mounted on SEM stub at extra cost (see ‘SEM mount’).. |
144 | $1295 |
| Model 300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period). W-coated Photoresist on Si.
Substrate: Silicon about 4×3 mm. Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request. . |
288 | $562 |
| Model 301BE Calibration specimen, 292 nm pitch, 1 dimension (Ti lines on Si) | 292 | $1364 |
| Model 300-2D Calibration specimen, 2-dimensional, 297 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si.
Substrate: Silicon about 4×3 mm. Default mounting: on 12 or 15 mm diam. steel disk. On request, supplied unmounted or mounted on SEM stub (extra charge – see SEM Mount) |
297 | $1173 |
| Model 700-1D Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si.
Substrate: Silicon about 4×3 mm. Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request. .. |
700 | $439 |
| Model 700-2D Calibration specimen, 2-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si.
Substrate: Silicon about 4×3 mm. Default mounting: on 12 or 15 mm diam. steel disk. Available unmounted on request. |
700 | $879 |
| Model 750-HD Calibration specimen, 1-Dimensional with Height, high durability, 750 nm nominal period; 100 nm nominal height (refer to certificate for actual values), solid Ni.
Substrate: Nickel about 6.25 mm diameter. Default mounting: Unmounted. |
750 | $341 |
Sample Mounting
| SEM Mount – Mount calibration specimen on SEM mount.
Default mounting: on pin stub type A using colloidal graphite paint. Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm. |
$136 |
| SEM Mount Cert – Mount traceable specimen on SEM mount.
Default mounting: on pin stub type A using colloidal graphite paint. Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm. |
$273 |
Certification Service
| Item | Price |
| Cert-1 Calibration of One dimensional pitch specimen, traceable to National Laboratory.. | $3409 |
| Cert-2 Calibration of Two dimensional specimen, traceable to National Laboratory.. | $6136 |
| Recert-1 Re-Calibration of One dimensional pitch specimen, traceable to National Laboratory | $2727 |
| ReCert-2 Re-Calibration of Two dimensional pitch specimen, traceable to National Laboratory | $4910 |
| Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price. |
* See Calibration certificate for precise value
Test Specimen
| Item | Price |
| PT – Phase Imaging Test Specimen | $206 |
| Model 751-HD Nickel NanoChannel Array Substrate. Lot 3594. Channel width about 370 nm, depth about 180 nm.
Usable in AFM and STM (intended as consumable supply for nanomechanical/nanofluidics imaging) |
$107 |
Probes
Silicon Nitride AFM Probes for contact mode or tapping in liquid
| Item | Price |
| SiN AFM probes, oxide-sharpened (box of 24 pcs), grade 1 | 340 |
| SiN AFM probes, oxide-sharpened, Grade 2 (price is per-probe) Minimum order sizes apply | 7.10 |
| SiN AFM probes, standard (box of 24 pcs), grade 1 | 192 |
| SiN AFM probes, standard, Grade 2 (price is per-probe) Minimum order sizes apply | 4 |
| SiN AFM probes, Cr-coated, grade 1, box of 24 pieces (if available) | 288 |
| SiN AFM probes, Cr-coated, grade 2, box of 24 pieces (if available) | 144 |
| Notes: | |
| Grade 1 probes have 4 tips per probe. | |
| Grade 2 probes have 1-3 tips per probe. | |
| Practice grade probes have 1-4 tips per probe and some of the tips have been used. |
Silicon AFM probes for Tapping Mode in air
| Si AFM probes, standard type, (for an order of 5-20 pcs) (per probe) | 40 |
| Si AFM probes, standard type, for each piece over 20 pcs in a single order (per probe) | 24 |
| Example: 30 pcs. costs $1040 (20*40 + 10*24) | |
| Si AFM probes, practice grade (for an order < 90 pcs) | 11 |
| Si AFM probes, practice grade (for an order > 90 pcs) | 8 |
| Note: Our AFM Probes are similar to those described at www.brukerafmprobes.com |
Sample Holders for Dimension AFM
| Item | Price |
| MV-1 Mini-vise | ask |
| SH-1 Stub holder (SEM and BEEM) | ask |
| TT-1 Tilt Table | ask |
Ordering Information
Minimum Order Requirements
$200 Domestic
$300 for export
$30 small order fee applies when the merchandise value is less than the minimum.
Terms
We strongly encourage the use of credit cards for purchases under $1000. We accept MaseterCard (Eurocard), Visa, Discover (Novus), and American Express.
For orders over $1000 we accept purchase orders wtih Net 30 days on approved credit.
F.O.B. our plant, Indianapolis.
All prices are in US Dollars.
Warranty
Supplies are sold with a 30-day money-back guarantee. An additional parts and labor warranty may apply on equipment, if stated on our quotation or invoice.
If a warranty is stated on our invoice, that warranty will apply.
No other warranty applies.