SPM, AFM, STM, and SEM Calibration Samples

(Nominal pitch values are approximate and for informational purposes only.  See calibration certificates provided with the specimens for more detailed information.)

Traceable Calibration Specimens

Item Nominal Pitch (nm) Price
70-1DUTC Traceable Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si.Limited number available.

Substrate: Silicon about 4×3 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request.

Available mounted on SEM stub at extra cost (see “SEM mount, cert.”)

70 $5070
Model 145TC Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass.

Substrate: Glass about 4×6 mm.

Default mounting: on 12 or 15 mm diam. steel disk.
Available unmounted on request.

144 $4159
Model 150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si…Substrate: Silicon about 4×3 mm…Default mounting: on 12 or 15 mm diam. steel disk…Available unmounted on request. ..Available mounted on SEM stub at extra cost (see ‘SEM mount, cert.’). 144 $7432
Model 292UTC Universal Traceable Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual period), Ti on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: Unmounted.

Available mounted on 12 or 15 mm diam. steel disk on request.

Available mounted on SEM stub at extra cost (see ‘SEM mount, cert.’)..

292 $4774
Model 700-1DUTC Universal Traceable Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to calibration certificate for actual period), W-coated photoresist on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: Unmounted.

Available mounted on 12 or 15 mm diam. steel disk on request.

Available mounted on SEM stub at extra cost (see “SEM mount, cert.”)

700 $4068

Calibration References

Item Nominal Pitch (nm) Price
Model 70-1D Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si.

Substrate: Silicon about 4×3 mm.

Mounted on Steel Disk Very limited number available.

70 $1661
Model 150-1D Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass.

Substrate: Glass about 4×6 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request…

144 $750
Model 150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si.

Substrate: Silicon about 4×3 mm…Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request..

Available mounted on SEM stub at extra cost (see ‘SEM mount’)..

144 $1295
Model 300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period). W-coated Photoresist on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request. .

288 $562
Model 301BE Calibration specimen, 292 nm pitch, 1 dimension (Ti lines on Si) 292 $1364
Model 300-2D Calibration specimen, 2-dimensional, 297 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

On request, supplied unmounted or mounted on SEM stub (extra charge – see SEM Mount)

297 $1173
Model 700-1D Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request. ..

700 $439
Model 700-2D Calibration specimen, 2-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si.

Substrate: Silicon about 4×3 mm.

Default mounting: on 12 or 15 mm diam. steel disk.

Available unmounted on request.

700 $879
Model 750-HD Calibration specimen, 1-Dimensional with Height, high durability, 750 nm nominal period; 100 nm nominal height (refer to certificate for actual values), solid Ni.

Substrate: Nickel about 6.25 mm diameter.

Default mounting: Unmounted.

750 $341

Sample Mounting

SEM Mount – Mount calibration specimen on SEM mount.

Mount Descriptions

Default mounting: on pin stub type A using colloidal graphite paint.

Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm.

$136
SEM Mount Cert – Mount traceable specimen on SEM mount.

Mount Descriptions

Default mounting: on pin stub type A using colloidal graphite paint.

Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm.

$273

Certification Service

Item Price
Cert-1 Calibration of One dimensional pitch specimen, traceable to National Laboratory.. $3409
Cert-2 Calibration of Two dimensional specimen, traceable to National Laboratory.. $6136
Recert-1 Re-Calibration of One dimensional pitch specimen, traceable to National Laboratory $2727
ReCert-2 Re-Calibration of Two dimensional pitch specimen, traceable to National Laboratory $4910
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price.

* See Calibration certificate for precise value

Test Specimen

Item Price
PT – Phase Imaging Test Specimen $206
Model 751-HD Nickel NanoChannel Array Substrate. Lot 3594. Channel width about 370 nm, depth about 180 nm.

Usable in AFM and STM (intended as consumable supply for nanomechanical/nanofluidics imaging)

$107

Probes

Silicon Nitride AFM Probes for contact mode or tapping in liquid

Item Price
SiN AFM probes, oxide-sharpened (box of 24 pcs), grade 1 340
SiN AFM probes, oxide-sharpened, Grade 2 (price is per-probe) Minimum order sizes apply 7.10
SiN AFM probes, standard (box of 24 pcs), grade 1          192
SiN AFM probes, standard, Grade 2 (price is per-probe) Minimum order sizes apply 4
SiN AFM probes, Cr-coated, grade 1, box of 24 pieces (if available) 288
SiN AFM probes, Cr-coated, grade 2, box of 24 pieces (if available) 144
Notes:
Grade 1 probes have 4 tips per probe.
Grade 2 probes have 1-3 tips per probe.
Practice grade probes have 1-4 tips per probe and some of the tips have been used.

Silicon AFM probes for Tapping Mode in air

Si AFM probes, standard type, (for an order of 5-20 pcs) (per probe) 40
Si AFM probes, standard type, for each piece over 20 pcs in a single order           (per probe) 24
Example:         30 pcs. costs $1040 (20*40 + 10*24)
Si AFM probes, practice grade (for an order < 90 pcs) 11
Si AFM probes, practice grade (for an order > 90 pcs) 8
Note: Our AFM Probes are similar to those described at www.brukerafmprobes.com

Sample Holders for Dimension AFM

Item Price
MV-1 Mini-vise ask
SH-1 Stub holder (SEM and BEEM) ask
TT-1 Tilt Table ask

Ordering Information

Minimum Order Requirements

$200 Domestic
$300 for export
$30 small order fee applies when the merchandise value is less than the minimum.

Terms

We strongly encourage the use of credit cards for purchases under $1000.  We accept MaseterCard (Eurocard), Visa, Discover (Novus), and American Express.

For orders over $1000 we accept purchase orders wtih Net 30 days on approved credit.
F.O.B. our plant, Indianapolis.

All prices are in US Dollars.

Warranty

Supplies are sold with a 30-day money-back guarantee.  An additional parts and labor warranty may apply on equipment, if stated on our quotation or invoice.

If a warranty is stated on our invoice, that warranty will apply.

No other warranty applies.

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