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Advanced Surface Microscopy, Inc.

The site for all your Atomic Force Microscopy needs

  • Home
    • AFM Analysis
    • ASM Buys and Sells Used (Second-Hand) NanoScope AFMs
    • Calibration specimens, Probes, and other Microscopy Supplies
    • Repair of NanoScope AFMs
    • Industries and materials
    • About ASM
  • AFM Analysis
    • Materials Analysis
    • About AFM
      • Atomic Force Microscopy: Exotic Invention of Practical Tool?
      • Summary of Techniques
        • Phase Imaging
          • Comparison of Phase and Friction Imaging
        • Surface Potential/Kelvin Probe Imaging
        • Friction Imaging
          • Comparison of Phase and Friction Imaging
        • Surface Roughness
        • Edge Roughness
        • Rk Parameters
    • Materials and Devices Analyzed
    • Expert Services and Litigation Support
    • Educational Demonstration Experiments in Scanning Probe Microscopy
  • Buy and Sells Used NanoScope AFMs
    • Equipment Overview
      • Overview of Used Equipment we Sell
      • D3000 and D3100
        • Typical D3100 System
        • Typical D3000 System
      • Dimension 5000 Atomic Force Microscope
      • Multimode
        • Top View Video Microscope
        • STM Converter for Multimode
      • BioScope
      • Replacement PC’s
      • We Buy NanoScopes
        • Identifying NanoScope AFM Equipment
          • NanoScope Controllers
  • Calibration Specimens, Probes, and Other Microscopy Supplies
    • Nanometer Calibration and Test Specimens
      • 70-1D/70-IDUTC
        • 70-1D/70-1DUTC Q&A
      • 150-2D/150-2DUTC
        • 150-2D Details
      • 150-1D/145TC
      • 301BE/292UTC
      • 700-1D/700-1DUTC
      • 750-HD
      • Available SEM Mounts
      • Traceable Nanometer Calibration Specimens
      • Calibration Drift
    • Accessories
      • MV-1 Mini-Vise
      • SH-1 Stub Holder
    • AFM Probes
    • Special Sale Items
    • Current Prices
  • Repair of NanoScope AFMs
    • NanoScope Repair and Upgrades
      • Z Drift and its Repair
      • Identifying NanoScope AFM Equipment
        • NanoScope Controllers
    • Repairs/Support for VX200 and 300 series AFM’s
    • Large Stock of NanoScope Repair Components
  • Industries and materials
    • Films and Coatings
    • AFM in the Automotive Industry
    • AFM in the Biomedical Field
      • Collagen Fibers
      • DNA
    • AFM in the Chemical Industry
    • AFM in the Energy Industry
    • AFM and the Polymer Industry
    • AFM in the Photonics Industry
    • AFM in the Telecommunications Industry
    • Materials and Devices Analyzed
      • Metals
        • Corrosion
      • Electronic Materials
  • Measurement Software
    • DiscTrack Plus Media Measurement System
      • About DiscTrack Plus
      • A Tale of Two Bumps
      • Feature shape characterization
      • Sophisticated Tools to Simplify Analysis
      • Edge Roughness
      • Precision Measurement of Optical Disc Media and More
      • Calibration Drift
    • SPIP: Scanning Probe Advanced Image Processor
    • Rk Parameters
  • About ASM
    • About ASM
      • Our Staff
        • Dr. Donald A. Chernoff, President
          • Publications and Patents
        • Senior Analytical Scientist David L. Burkhead
      • Training, Consulting, and Expert Services
        • Expert Services and Litigation Support
        • Educational Demonstration Experiments in Scanning Probe Microscopy
      • Our Patents
      • ASM’s Phase Image Wins 1997 DI Calendar Award
      • Remembering Yale Strausser
    • Testimonials
    • FAQ
    • Links of interest
  • Contact
  • News and Information

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Advanced Surface Microscopy
Repair

Repair

Repair your NanoScope AFM or STM We can perform many repairs on older NanoScope Brand Atomic Force Microscopes.

Now:  Z drift repair

Repair your Veeco/Bruker Dimension Vx Atomic Force Profiler and Dimension 7000 and 9000 Atomic Force Profilers.

We can help with other Automated NanoScope brand AFMs (Dimension 7000 and Dimension 9000) and with Dimension 3100 and 5000 that also use the Veeco Metrology closed loop scanners.

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