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Advanced Surface Microscopy, Inc.

Your site for all your Atomic Force Microscopy needs

  • Home
    • AFM Analysis
    • ASM Buys and Sells Used (Second-Hand) NanoScope AFMs
    • Supplies
    • Repair
    • Industries and materials
    • About ASM
  • AFM Analysis
    • Materials Analysis
    • About AFM
      • Atomic Force Microscopy: Exotic Invention of Practical Tool?
      • Summary of Techniques
        • Phase Imaging
          • Comparison of Phase and Friction Imaging
        • Surface Potential/Kelvin Probe Imaging
        • Friction Imaging
          • Comparison of Phase and Friction Imaging
        • Surface Roughness
        • Edge Roughness
        • Rk Parameters
    • Materials and Devices Analyzed
    • Expert Services and Litigation Support
    • Educational Demonstration Experiments in Scanning Probe Microscopy
  • Buy and Sells Used NanoScope AFMs
    • Equipment Overview
      • Overview of Used Equipment we Sell
      • D3000 and D3100
        • Typical D3100 System
        • Typical D3000 System
      • Dimension 5000 Atomic Force Microscope
      • Multimode
        • Top View Video Microscope
        • STM Converter for Multimode
      • BioScope
      • Replacement PC’s
      • We Buy NanoScopes
        • Identifying NanoScope AFM Equipment
          • NanoScope Controllers
  • Supplies
    • Nanometer Calibration and Test Specimens
      • 70-1D/70-IDUTC
        • 70-1D/70-1DUTC Q&A
      • 150-2D/150-2DUTC
        • 150-2D Details
      • 150-1D/145TC
      • 301BE/292UTC
      • 700-1D/700-1DUTC
      • 750-HD
      • Available SEM Mounts
      • Traceable Nanometer Calibration Specimens
      • Calibration Drift
    • Accessories
      • MV-1 Mini-Vise
      • SH-1 Stub Holder
    • AFM Probes
    • Special Sale Items
    • Software
    • Current Prices
  • Repair
    • NanoScope Repair and Upgrades
      • Z Drift and its Repair
      • Identifying NanoScope AFM Equipment
        • NanoScope Controllers
    • Repairs/Support for VX200 and 300 series AFM’s
    • Large Stock of NanoScope Repair Components
  • Industries and materials
    • Films and Coatings
    • AFM in the Automotive Industry
    • AFM in the Biomedical Field
      • Collagen Fibers
      • DNA
    • AFM in the Chemical Industry
    • AFM in the Energy Industry
    • AFM and the Polymer Industry
    • AFM in the Photonics Industry
    • AFM in the Telecommunications Industry
    • Materials and Devices Analyzed
      • Metals
        • Corrosion
      • Electronic Materials
  • Measurement Software
    • DiscTrack Plus Media Measurement System
      • About DiscTrack Plus
      • A Tale of Two Bumps
      • Feature shape characterization
      • Sophisticated Tools to Simplify Analysis
      • Edge Roughness
      • Precision Measurement of Optical Disc Media and More
      • Calibration Drift
    • SPIP: Scanning Probe Advanced Image Processor
    • Rk Parameters
  • About ASM
    • About ASM
      • Our Staff
        • Dr. Donald A. Chernoff, President
          • Publications and Patents
        • Senior Analytical Scientist David L. Burkhead
      • Training, Consulting, and Expert Services
        • Expert Services and Litigation Support
        • Educational Demonstration Experiments in Scanning Probe Microscopy
      • Our Patents
      • ASM’s Phase Image Wins 1997 DI Calendar Award
      • Remembering Yale Strausser
    • Testimonials
    • FAQ
    • Links of interest
  • Contact

Website Breadcrumbs

Home
Our Staff

Our Staff

Meet the Staff

  • Donald A. Chernoff – President & CEO
  • David L. Burkhead – Senior Analytical Scientist

Other notes

  • We remember Yale Strausser

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