Yale Strausser passed away on November 26, 1998. I knew him for only 5 or 6 years, during his time with Digital Instruments. He was a quiet leader. His soft-spoken, but confident, manner and his depth of knowledge made him a valueable colleague and trusted friend.

He was generous with his knowledge and taught me a lot. For example, it was Yale who helped me understand the AFM image of an epitaxial Silicon film in terms of the crystallographic orientation of the underlying Silicon Wafer. So, when I see the beauty of this delicate image, I am reminded of him. — Don Chernoff.

Epitaxial Silicon (1 micron scan, Z range 1 nm)