This is a small sampling of the materials and devices analyzed at ASM using AFM and related techniques.

  • Carbon fibers
  • Aluminum coil and foil
  • Steel coil
  • Wood pulp
  • Paper
  • Coatings for paper
  • Inks
  • Ink jet heads
  • Photographic film
  • Nanoindentation, scratching and wear studies
  • Paint coating systems
  • Polymer latex particles and materials
  • Polymers
  • Polymer blends, copolymers
  • Magnetic Disks
  • Magnetic Recording heads (including magnetic imaging of active devices)
  • Contaminants on surfaces
  • Compact discs, CD-R, etc.
  • DVD, DVD+RW, etc.
  • Other optical discs
  • Calibration specimens
  • High accuracy measurements of size, shape and position of microscopic features (such as data marks)
  • Optical gratings, with high accuracy measurement of groove profiles
  • Optical fibers
  • Ceramic fibers
  • Hair
  • Skin
  • Collagen fibers
  • Individual collagen molecules (measure molecular weight by length; image branched structures)
  • Individual DNA molecules
  • Biomedical implants:       hips, etc. Test coupons, fresh and worn surfaces
  • Medical diagnostic devices
  • Pharmaceutical materials, structural characterization in context of performance attributes such as flowability and dissolution or to meet regulatory requirements for general characterization.
  • Glass
  • Silicon wafers
  • Polished and superpolished surfaces
  • Electrically active materials
  • Surface potential measurements of active electrical devices
  • Thin film materials:       roughness, grain visualization.
  • Metrology of Semiconductor and other materials
  • Corrosion samples
  • Zirconium oxide