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Advanced Surface Microscopy, Inc.
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AFM Analysis
ASM Buys and Sells Used (Second-Hand) NanoScope AFMs
Calibration specimens, Probes, and other Microscopy Supplies
Repair of NanoScope AFMs
Industries and materials
About ASM
AFM Analysis
Materials Analysis
About AFM
Atomic Force Microscopy: Exotic Invention of Practical Tool?
Summary of Techniques
Phase Imaging
Comparison of Phase and Friction Imaging
Surface Potential/Kelvin Probe Imaging
Friction Imaging
Comparison of Phase and Friction Imaging
Surface Roughness
Edge Roughness
Rk Parameters
Materials and Devices Analyzed
Expert Services and Litigation Support
Educational Demonstration Experiments in Scanning Probe Microscopy
Buy and Sells Used NanoScope AFMs
Equipment Overview
Overview of Used Equipment we Sell
D3000 and D3100
Typical D3100 System
Typical D3000 System
Dimension 5000 Atomic Force Microscope
Multimode
Top View Video Microscope
STM Converter for Multimode
BioScope
Replacement PC’s
We Buy NanoScopes
Identifying NanoScope AFM Equipment
NanoScope Controllers
Calibration Specimens, Probes, and Other Microscopy Supplies
Nanometer Calibration and Test Specimens
70-1D/70-IDUTC
70-1D/70-1DUTC Q&A
150-2D/150-2DUTC
150-2D Details
150-1D/145TC
301BE/292UTC
700-1D/700-1DUTC
750-HD
Available SEM Mounts
Traceable Nanometer Calibration Specimens
Calibration Drift
Accessories
MV-1 Mini-Vise
SH-1 Stub Holder
AFM Probes
Special Sale Items
Current Prices
Repair of NanoScope AFMs
NanoScope Repair and Upgrades
Z Drift and its Repair
Identifying NanoScope AFM Equipment
NanoScope Controllers
Repairs/Support for VX200 and 300 series AFM’s
Large Stock of NanoScope Repair Components
Industries and materials
Films and Coatings
AFM in the Automotive Industry
AFM in the Biomedical Field
Collagen Fibers
DNA
AFM in the Chemical Industry
AFM in the Energy Industry
AFM and the Polymer Industry
AFM in the Photonics Industry
AFM in the Telecommunications Industry
Materials and Devices Analyzed
Metals
Corrosion
Electronic Materials
Measurement Software
DiscTrack Plus Media Measurement System
About DiscTrack Plus
A Tale of Two Bumps
Feature shape characterization
Sophisticated Tools to Simplify Analysis
Edge Roughness
Precision Measurement of Optical Disc Media and More
Calibration Drift
SPIP: Scanning Probe Advanced Image Processor
Rk Parameters
About ASM
About ASM
Our Staff
Dr. Donald A. Chernoff, President
Publications and Patents
Senior Analytical Scientist David L. Burkhead
Training, Consulting, and Expert Services
Expert Services and Litigation Support
Educational Demonstration Experiments in Scanning Probe Microscopy
Our Patents
ASM’s Phase Image Wins 1997 DI Calendar Award
Remembering Yale Strausser
Testimonials
FAQ
Links of interest
Contact
News and Information
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